Precise measurement of density and structure of undercooled molten silicon by using synchrotron radiation combined with electromagnetic levitation technique-Reference-Cited by-同舟云学术

Precise measurement of density and structure of undercooled molten silicon by using synchrotron radiation combined with electromagnetic levitation technique

Published:2005-01-20 Issue:2 Volume:16 Page:381-385
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Higuchi K,Kimura K,Mizuno A,Watanabe M,Katayama Y,Kuribayashi K

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Reference15 articles.

1. Icosahedral Short-Range Order in Deeply Undercooled Metallic Melts

2. First X-Ray Scattering Studies on Electrostatically Levitated Metallic Liquids: Demonstrated Influence of Local Icosahedral Order on the Nucleation Barrier

3. Structure of supercooled liquid silicon

4. X-ray diffraction study of undercooled molten silicon

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