First principles simulation technique for characterizing single event effects
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Reference29 articles.
1. Basic mechanisms and modeling of single-event upset in digital microelectronics
2. Impact of Ion Energy and Species on Single Event Effects Analysis
3. Total Ionizing Dose and Single Event Effects Hardness Assurance Qualification Issues for Microelectronics
4. Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection
5. Review of displacement damage effects in silicon devices
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