Total ionizing dose effect in an input/output device for flash memory
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Reference20 articles.
1. Radiation Effects in MOS Capacitors with Very Thin Oxides at 80degK
2. Generation of Interface States by Ionizing Radiation in Very Thin MOS Oxides
3. Total-Ionizing-Dose Effects in Modern CMOS Technologies
4. Two-dimensional methodology for modeling radiation-induced off-state leakage in CMOS technologies
5. Total-ionizing-dose effects on isolation oxides in modern CMOS technologies
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1. Radiation induced parasitic effect in silicon-on-insulator metal-oxide-semiconductor field-effect transistor;Acta Physica Sinica;2018
2. Total ionizing dose induced single transistor latchup in 130-nm PDSOI input/output NMOSFETs;Chinese Physics B;2017-03
3. Utilizing a shallow trench isolation parasitic transistor to characterize the total ionizing dose effect of partially-depleted silicon-on-insulator input/output n-MOSFETs;Chinese Physics B;2014-09
4. Effect of ionizing radiation on dual 8-bit analog-to-digital converters (AD9058) with various dose rates and bias conditions;Chinese Physics B;2013-09
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