Thickness dependence of the optical constants of oxidized copper thin films based on ellipsometry and transmittance
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
https://iopscience.iop.org/article/10.1088/1674-1056/23/8/087802/pdf
Reference26 articles.
1. Measured optical constants of copper from 10 nm to 35 nm
2. Oxidation kinetics of nanoscale copper films studied by terahertz transmission spectroscopy
3. The determination of the thickness and the optical dispersion property of gold film using spectroscopy of a surface plasmon in the frequency domain
4. The room temperature oxidation of Cu (111): Pressure effects
5. Native Oxide Layers Formed on the Surface of Ultra High-Purity Iron and Copper Investigated by Angle Resolved XPS
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