Development of scanning electron microscope-compatible multiaxial miniature testing system
Author:
Funder
Division of Civil, Mechanical and Manufacturing Innovation
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://iopscience.iop.org/article/10.1088/1361-6501/ab1ca6/pdf
Reference28 articles.
1. In situ nanomechanical testing in focused ion beam and scanning electron microscopes
2. Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials
3. A simple straining stage for the scanning electron microscope
4. An hydraulic straining stage for use in scanning electron microscopes
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