A measurement system for the photoelectric and electrical characterization of modern semiconductor devices
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/28/i=5/a=055012/pdf
Reference22 articles.
1. The MOS System
2. The Analysis of Photoelectric Sensitivity Curves for Clean Metals at Various Temperatures
3. Photoinjection into SiO2: Use of Optical Interference to Determine Electron and Hole Contributions
4. Interface Barrier Energy Determination from Voltage Dependence of Photoinjected Currents
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