Double-plate calibration for coil capacitance effect and application in high-frequency eddy-current testing

Author:

Xu JinORCID,Lei Yinzhao

Abstract

Abstract In high-frequency eddy-current testing, the coil impedance is often seriously affected by the capacitance effect, while the existing calibration method only corrects the capacitive couplings within the coil itself and ignores the coupling between the coil and the conductor. Combined with the equivalent circuit, a correction method for both the capacitive couplings is proposed using single-plate calibration. Furthermore, considering the skin effect at high frequencies, which leads to the calculation error of coil impedance, a modified impedance is introduced in the equivalent circuit and the double-plate calibration is presented. Using the two proposed methods and the existing calibration method, the experimental values of the coil impedance were respectively corrected when the coil was on a single-coated plate (titanium coating and TiAl6V4 titanium alloy substrate), and compared with the theoretical values between 1 and 100 MHz. The results show a sequentially improved correction effect of the existing calibration method, single-plate calibration, and double-plate calibration. Combined with the Levenberg–Marquardt method, the double-plate calibration was applied to the parameter measurement of the conductive plate with tens of micrometer coating. Through analyzing the sensitivity function of each tested parameter, we employed the inductance to calculate the substrate conductivity at hundreds of kilohertz and the resistance to calculate the coating thickness and conductivity at tens of megahertz. The parameters of three single-coated plates with coating thicknesses of 23 μm, 32 μm and 52 μm were respectively tested, and the results show that the relative measurement errors of all parameters are less than 15%.

Funder

National Natural Science Foundation of China

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3