Coupling Relationship and Decoupling Method for Thickness and Conductivity Measurement of Ultra-Thin Metallic Coating Using Swept-Frequency Eddy-Current Technique-Reference-Cited by-同舟云学术

Coupling Relationship and Decoupling Method for Thickness and Conductivity Measurement of Ultra-Thin Metallic Coating Using Swept-Frequency Eddy-Current Technique

Published:2022 Issue: Volume:71 Page:1-9
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Xu Jin¹^ORCID,Wang Dongli¹^ORCID,Xin Wei²^ORCID

Affiliation:

1. College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China

2. China Special Equipment Inspection and Research Institute, Beijing, China

Funder

Fundamental Research Funds for the Central Universities

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/9717300/09828537.pdf?arnumber=9828537

Reference26 articles.

1. Analytical Solutions to Eddy‐Current Probe‐Coil Problems

2. Thickness and conductivity of metallic layers from eddy current measurements

3. Quantitative evaluation of thermal barrier coating based on eddy current technique

4. Thermal Barrier Coatings for Gas-Turbine Engine Applications

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