Recent surface reflectance measurement campaigns with emphasis on best practices, SI traceability and uncertainty estimation-Reference-Cited by-同舟云学术

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Recent surface reflectance measurement campaigns with emphasis on best practices, SI traceability and uncertainty estimation

Published:2012-03-02 Issue:2 Volume:49 Page:S21-S28
ISSN:0026-1394
Container-title:Metrologia
language:
Short-container-title:Metrologia

Author:

Helder Dennis,Thome Kurt,Aaron Dave,Leigh Larry,Czapla-Myers Jeff,Leisso Nathan,Biggar Stuart,Anderson Nik

Publisher

IOP Publishing

Subject

General Engineering

Link

http://stacks.iop.org/0026-1394/49/i=2/a=S21/pdf

Reference8 articles.

1. Initial results of the bidirectional reflectance characterization round-robin in support of EOS

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