Absolute calibration of X-ray semiconductor detectors against synchrotron radiation of the VEPP-3 storage ring
Author:
Publisher
IOP Publishing
Subject
General Engineering
Link
http://stacks.iop.org/0026-1394/37/i=5/a=34/pdf
Reference9 articles.
1. Measurements of the absolute spectral sensitivity of X-ray semiconductor detectors in the photon energy range of 1.5–15 keV using “white” SR beam of the VEPP-3 storage ring
2. X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92
3. Measurement of the mean electron‐hole pair creation energy in crystalline silicon for photons in the 50–1500 eV spectral range
4. Self‐calibration of semiconductor photodiodes in the soft x‐ray region
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