X-ray Optics in Metrological Applications
Author:
Publisher
IOP Publishing
Subject
General Engineering
Link
http://stacks.iop.org/0026-1394/27/i=3/a=003/pdf
Reference8 articles.
1. Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal
2. X-Ray to Visible Wavelength Ratios
3. Calibration Of Optical And Mechanical Sensors By X-Ray Interferometry
4. The skew-symmetric two-crystal X-ray interferometer
5. High precision x-ray metrology
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1. Measurement of miscut angles in the determination of Si lattice parameters;Metrologia;2021-04-29
2. Absolute X-ray energy measurement using a high-accuracy angle encoder;Journal of Synchrotron Radiation;2021-01-01
3. X-ray crystal interferometers;Physics-Uspekhi;2014-11-30
4. Development of an Angle Calibration System with a Combined Silicon Polygon and Angle Interferometer;Japanese Journal of Applied Physics;2006-06-08
5. Advances in Scanning Force Microscopy for Dimensional Metrology;CIRP Annals;2006
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