Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal-Reference-Cited by-同舟云学术

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Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal

Published:1981-06-08 Issue:23 Volume:46 Page:1540-1543
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Becker Peter,Dorenwendt Klaus,Ebeling Gerhard,Lauer Rolf,Lucas Wolfgang,Probst Reinhard,Rademacher Hans-Joachim,Reim Gerhard,Seyfried Peter,Siegert Helmut

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.46.1540/fulltext

Reference15 articles.

1. Principles and design of Laue-case X-Ray interferometers

2. A two-crystal X-ray interferometer

3. X-Ray to Visible Wavelength Ratios

4. Determination of the Avogadro Constant

5. Avogadro Constant—Corrections to an Earlier Report

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