Quantitative analysis of Cu(In,Ga)Se2thin films by secondary ion mass spectrometry using a total number counting method-Reference-Cited by-同舟云学术

Quantitative analysis of Cu(In,Ga)Se2thin films by secondary ion mass spectrometry using a total number counting method

Published:2012-06-13 Issue:4 Volume:49 Page:522-529
ISSN:0026-1394
Container-title:Metrologia
language:
Short-container-title:Metrologia

Author:

Jang Jong Shik,Hwang Hye Hyen,Kang Hee Jae,Suh Jung Ki,Min Hyung Sik,Han Myung Sub,Cho Kyung Haeng,Chung Yong-Duck,Cho Dae-Hyung,Kim Jeha,Kim Kyung Joong

Publisher

IOP Publishing

Subject

General Engineering

Link

http://stacks.iop.org/0026-1394/49/i=4/a=522/pdf

Reference25 articles.

1. Final report on Key Comparison K67 and parallel Pilot Study P108: Measurement of composition of a thin Fe–Ni alloy film

2. Inter-laboratory comparison: Quantitative surface analysis of thin Fe-Ni alloy films

3. 19·9%-efficient ZnO/CdS/CuInGaSe2 solar cell with 81·2% fill factor

4. Analytical versus numerical analysis of back grading in CIGS solar cells

5. Band‐gap engineering in CdS/Cu(In,Ga)Se2 solar cells

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