Cross-sectional scanning thermal microscopy of ErAs/GaAs superlattices grown by molecular beam epitaxy-Reference-Cited by-同舟云学术

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Cross-sectional scanning thermal microscopy of ErAs/GaAs superlattices grown by molecular beam epitaxy

Published:2015-06-09 Issue:26 Volume:26 Page:265701
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Park K W,Krivoy E M,Nair H P,Bank S R,Yu E T

Funder

Division of Materials Research

Office of Naval Research

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/26/i=26/a=265701/pdf

Reference38 articles.

1. Thermal conductivity of individual silicon nanowires

2. Enhanced thermoelectric performance of rough silicon nanowires

3. Silicon nanowires as efficient thermoelectric materials

4. Ultralow Thermal Conductivity in Disordered, Layered WSe 2 Crystals

5. Precise control of thermal conductivity at the nanoscale through individual phonon-scattering barriers

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