Dynamic force microscopy with quartz tuning forks at high oscillation amplitudes
Author:
Publisher
IOP Publishing
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Link
http://stacks.iop.org/0957-4484/18/i=8/a=084019/pdf
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1. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
2. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
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1. Plasma Polymerized Films for Mass Sensitive Biosensors;Natural and Applied Sciences Journal;2019-06-30
2. Design and implementation of a novel horizontal AFM probe utilizing a quartz tuning fork;International Journal of Precision Engineering and Manufacturing;2018-01
3. High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy;Scientific Reports;2015-07-03
4. Improve performance of scanning probe microscopy by balancing tuning fork prongs;Ultramicroscopy;2009-03
5. Dynamics of probes attached to quartz tuning forks for the detection of surface forces;Nanotechnology;2007-09-07
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