Analytical and numerical analysis of imaging mechanism of dynamic scanning electron microscopy-Reference-Cited by-同舟云学术

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Analytical and numerical analysis of imaging mechanism of dynamic scanning electron microscopy

Published:2012-10-11 Issue:43 Volume:23 Page:435501
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Schröter M-A,Holschneider M,Sturm H

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/23/i=43/a=435501/pdf

Reference25 articles.

1. Cantilever transducers as a platform for chemical and biological sensors

2. Nano-Mechanical Transduction of Polymer Micro-Cantilevers to Detect Bio-Molecular Interactions

3. Nanoelectromechanical systems

4. Imaging of flexural and torsional resonance modes of atomic force microscopy cantilevers using optical interferometry

5. Simulation of dynamic modes of atomic force microscopy using a 3D finite element model

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1. A method of magnetic field measurement in a scanning electron microscope using a microcantilever magnetometer;Metrology and Measurement Systems;2023-07-26

2. Impedance spectroscopy of electrostatically driven MEMS resonators;Measurement;2023-06

3. Enhanced DySEM imaging of cantilever motion using artificial structures patterned by focused ion beam techniques;Journal of Micromechanics and Microengineering;2016-02-04

4. Single-cycle atomic force microscope force reconstruction: resolving time-dependent interactions;New Journal of Physics;2013-08-13

5. Phase and amplitude patterns in DySEM mappings of vibrating microstructures;Nanotechnology;2013-04-25

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