Impact of post-deposition annealing on RF sputtered calcium copper titanate thin film for memory application
Author:
Publisher
IOP Publishing
Subject
Metals and Alloys,Polymers and Plastics,Surfaces, Coatings and Films,Biomaterials,Electronic, Optical and Magnetic Materials
Link
http://iopscience.iop.org/article/10.1088/2053-1591/aab87d/pdf
Reference57 articles.
1. Charge-trapping device structure of SiO2∕SiN∕high-k dielectric Al2O3 for high-density flash memory
2. Memory functions of nanocrystalline cadmium selenide embedded ZrHfO high-kdielectric stack
3. Low voltage and high ON/OFF ratio field-effect transistors based on CVD MoS2 and ultra high-k gate dielectric PZT
4. Charge trapping characteristics of atomic-layer-deposited HfO2 films with Al2O3 as a blocking oxide for high-density non-volatile memory device applications
5. Lead Lanthanum Zirconate Titanate Ceramic Thin Films for Energy Storage
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