On the Voltage and Frequency Distribution of Dielectric Properties and ac Electrical Conductivity in Al/SiO 2 /p-Si (MOS) Capacitors
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
https://iopscience.iop.org/article/10.1088/0256-307X/30/1/017301/pdf
Reference31 articles.
1. Frequency and temperature dependence of the dielectric and AC electrical conductivity in (Ni/Au)/AlGaN/AlN/GaN heterostructures
2. Studies of tunnel MOS diodes I. Interface effects in silicon Schottky diodes
3. Analysis of interface states of the pentacene organic thin-film phototransistor by conductance technique
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