Micro-cracks detection of multicrystalline solar cell surface based on self-learning features and low-rank matrix recovery

Author:

Qian Xiaoliang,Zhang Heqing,Yang Cunxiang,Wu Yuanyuan,He Zhendong,Wu Qing-E,Zhang Huanlong

Abstract

Purpose This paper aims to improve the generalization capability of feature extraction scheme by introducing a micro-cracks detection method based on self-learning features. Micro-cracks detection of multicrystalline solar cell surface based on machine vision is fast, economical, intelligent and easier for on-line detection. However, the generalization capability of feature extraction scheme adopted by existed methods is limited, which has become an obstacle for further improving the detection accuracy. Design/methodology/approach A novel micro-cracks detection method based on self-learning features and low-rank matrix recovery is proposed in this paper. First, the input image is preprocessed to suppress the noises and remove the busbars and fingers. Second, a self-learning feature extraction scheme in which the feature extraction templates are changed along with the input image is introduced. Third, the low-rank matrix recovery is applied to the decomposition of self-learning feature matrix for obtaining the preliminary detection result. Fourth, the preliminary detection result is optimized by incorporating the superpixel segmentation. Finally, the optimized result is further fine-tuned by morphological postprocessing. Findings Comprehensive evaluations are implemented on a data set which includes 120 testing images and corresponding human-annotated ground truth. Specifically, subjective evaluations show that the shape of detected micro-cracks is similar to the ground truth, and objective evaluations demonstrate that the proposed method has a high detection accuracy. Originality/value First, a self-learning feature extraction method which has good generalization capability is proposed. Second, the low-rank matrix recovery is combined with superpixel segmentation for locating the defective regions.

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering

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