Correlation analysis of wettability, intermetallic compound formation and PCB contamination

Author:

Steiner Frantisek,Rendl Karel,Wirth Vaclav

Abstract

Purpose – The purpose of this paper is to verify how solder joint properties correlate with soldering profile set-up. These characteristics act against each other. All observed properties may significantly affect the quality and reliability of solder joints. The purpose is also to design recommendations for manufacturers of electronic assemblies. Design/methodology/approach – The samples for experiment were reflowed by using a laboratory reflow oven. A LEXT laser confocal microscope was used for wetting angle and intermetallic compound (IMC) thickness measurement. The ionic contamination was measured by using a contaminometer. Findings – The appropriate choice of soldering profile is very important for the reliability of electronic assemblies. The higher temperatures or longer preheating and soldering times improve the wetting angle. Likewise, there is also the activation of all the fluxes. The result is low contamination with printed circuit boards (PCBs). On the other hand, we must not forget that higher temperatures and longer soldering time also affect the thickness of the IMC. The outer limits recommended by the manufacturer were selected for the soldering profile set-up. Even within these limits, it is possible to achieve an improvement in the wetting angle, an improvement in levels of PCB contamination and an increase in the thickness of the IMC. This paper presents the results achieved for solders Sn42Bi57.6Ag0.4, Sn96.5Ag3Cu0.5 and Sn97Ag3. Originality/value – The gained knowledge on the correlation between IMC thickness, solderability of PCB and PCB contamination caused by different soldering profile set-ups can help to prevent reliability problems because each of the named effects has a significant influence on reliability.

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering

Reference13 articles.

1. Association Connecting Electronics Industries (2012), “IPC TM-650-MDT. Test method development packet”.

2. Chan, C. , Tong, K. and Kwok, R. (2006), “Intermetallic compound formation and solderability for immersion tin”, Circuit World , Vol. 32 No. 4, pp. 3-8.

3. Defectsdatabase.npl.co.uk (2014), “Soldering defects database”, available at: http://defectsdatabase.npl.co.uk/defectsdb/defects_query.php (accessed 20 March 2014).

4. Drapala, J. , Kozelkova, R. , Burkovic, R. , Smetana, B. , Dudek, R. , Lasek, S. , Urbanek, J. , Dusek, K. and Hajek, M. (2009), “New types of lead-free solders on the base of tin and their properties”, Kovove Materialy-Metallic Materials , Vol. 47 No. 5, pp. 283-293.

5. Hansen, K. , Jellesen, M. , Moller, P. , Westermann, P. and Ambat, R. (2009), Effect of solder flux residues on corrosion of electronics. 2009 Annual Reliability and Maintainability Symposium , IEEE, Fort Worth, TX, pp. 502-508.

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3