ITRI project on electroless nickel/immersion gold joint cracking

Author:

F.D. B

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering

Reference3 articles.

1. Cordes, F. and Huemoeller, R. (1998), “Electroless nickel‐gold; is there a future? Electroless Ni/Au plating capability study of BGA packages”, Future Circuits, Vol. 3, December.

2. Mei, Z. (1998), “The effect of electroless Ni/immersion Au plating parameters on PBGA solder joint attachment reliability”, IPC National Conference Proceedings: A Summit on PWB Surface Finishes and Solderability, 22‐23 September, Austin, TX, pp. 19‐42.

3. Mei, Z. Kaufmann, M. and Johnson, P. (1997), “Interfacial fracture of BGA packages on electroless Ni/immersion Au and its relation to plating process”, IPC National Conference Proceedings: A Summit on PWB Surface Finishes and Solderability, 22‐23 September, Bloomington, MN, pp. 23‐45.

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