1. Borecki, J. and Serzysko, T. (2016), “Mechanical reliability of solder joints in PCBs assembled in surface mount technology”, Soldering & Surface Mount Technology, Vol. 28 No. 1, pp. 18-26, available at: www.emeraldinsight.com/doi/full/10.1108/SSMT-10-2015-0037
2. Borgesen, P., Yin, L. and Kondos, P. (2012), “Acceleration of the growth of Cu3Sn voids in solder joints”, Microelectronics Reliability, Vol. 52 No. 6, pp. 1121-1127, available at: http://linkinghub.elsevier.com/retrieve/pii/S0026271411005191
3. Dusek, K., Busek, D., Beran, T. and Rudajevova, A. (2015), “Comparison of shear strength of soldered SMD resistors for various solder alloys”, 2015 38th International Spring Seminar on Electronics Technology (ISSE), IEEE, pp. 237-240, available at: http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=7247997
4. Influence of mechanical stress and temperature aging on a change of electrical connection resistance,2008
5. Study of temperature profiles of the infrared continuous furnace,2011