Author:
Mittal Jagjiwan,Lin Kwang-Lung
Abstract
Purpose
This paper aims to study the diffusion of Zn, Ni and Sn in the liquid state during the reflow ageing of the Sn-Zn solder above its melting point on an Ni/Cu substrate in relation to the formation of intermetallic compounds (IMCs).
Design/methodology/approach
The Sn-Zn solder is reflowed on Ni/Cu substrates and is aged at 503 K. The formation of IMCs and their composition is characterized using scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDX). Diffusion coefficients and diffusion distances of Zn, Ni and Sn in the liquid state during reflow and ageing are theoretically calculated. Both experimental and theoretical behaviours for Ni and Zn diffusions are compared.
Findings
Calculations show a linear increment in the liquid-state diffusion coefficients of Ni, Zn and Sn in the solder matrix with a rise in temperature, but they remained constant during ageing. However, diffusion distances increased slowly with temperature but manifold with ageing time. The experimental results revealed segregation of Zn and Ni at the interface in the as-reflow aged specimens. The Zn was concentrated at the solder–substrate interface and it reacted with Ni diffusing from the substrate to form Ni-Sn-Zn IMCs. The rapid diffusion of Zn and Ni with the increase in ageing time increased their atomic concentrations in the IMCs against the reduction in Sn concentration owing to a comparatively slower diffusion.
Originality/value
The novelty of the paper is the detailed study of theoretical diffusion of Zn, Sn and Ni in the liquid state during reflow ageing of Sn-Zn above its melting points on a Ni/Cu substrate. This is compared with values obtained experimentally and related to the mechanisms of IMC formation.
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science,Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science
Reference47 articles.
1. Bhat, B.N. (1973), “Solute diffusion in liquid metals”, NASA technical report NASA TR R-417 N73-32032, USA.
2. Interfacial IMC layer growth and tensile properties of low‐silver Cu/SACBE/Cu solder joints;Soldering & Surface Mount Technology,2012
3. Diffusion coefficient of 111Sn, 124Sb, 111mAg and 195Au in liquid Sn;Physics Review B,1980
4. Inter-diffusion in liquid tin;Journal of Phase Equilibria and Diffusion,2006
5. Intermetallic compounds formed during the soldering reactions of eutectic Sn-9Zn with Cu and Ni substrates;Zeitschrift für Metallkunde,2002
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