Copper coin-embedded printed circuit board for heat dissipation: manufacture, thermal simulation and reliability
Author:
Chen Yuanming,Wang Shouxu,He Xuemei,He Wei,Silberschmidt Vadim V.,Tan Ze
Abstract
Purpose
– The purpose of this paper is to form copper coin-embedded printed circuit board (PCB) for high heat dissipation.
Design/methodology/approach
– Manufacturing optimization of copper coin-embedded PCB involved in the design and treatment of copper coin, resin flush removal and flatness control. Thermal simulation was used to investigate the effect of copper coin on heat dissipation of PCB products. Lead-free reflow soldering and thrust tests were used to characterize the reliable performance of copper coin-embedded PCB.
Findings
– The copper coin-embedded PCB had good agreement with resin flush removal and flatness control. Thermal simulation results indicated that copper coin could significantly enhance the heat-dissipation rate by means of a direct contact with the high-power integrated circuit chip. The copper coin-embedded PCB exhibited a reliable structure capable of withstanding high-temperature reflow soldering and high thrust testing.
Originality/value
– The use of a copper coin-embedded PCB could lead to higher heat dissipation for the stable performance of high-power electronic components. The copper coin-embedded method could have important potential for improving the design for heat dissipation in the PCB industry.
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering
Reference14 articles.
1. Bellakhal, N.
,
Draou, K.
,
Addou, A.
and
Brisset, J.L.
(2000), “Cleaning of copper foil coated with sodium hexanoate as corrosion inhibitor”,
Journal of Applied Electrochemistry
, Vol. 30 No. 5, pp. 595-600. 2. Buck, T.J.
(1992), “Advanced metal core substrates as a solution for multichip module backplanes”,
Circuit World
, Vol. 18 No. 2, pp. 20-26. 3. Caisse, C.J.
,
Coonrod, J.
and
Horn, A.F.
(2011), “Measurement of simulated active device and RF trace heating in high frequency circuit laminates”,
Circuit World
, Vol. 37 No. 4, pp. 3-9. 4. Chen, Y.
,
He, W.
,
Chen, X.
,
Wang, C.
,
Tao, Z.
,
Wang, S.
,
Zhou, G.
and
Moshrefi-Torbati, M.
(2014a), “Plating uniformity of bottom-up copper pillars and patterns for IC substrates with additive-assisted electrodeposition”,
Electrochimica Acta
, Vol. 120 No. 1, pp. 293-301. 5. Chen, Y.
,
He, W.
,
Zhou, G.
,
Tao, Z.
,
Wang, Y.
and
Luo, D.
(2013), “Failure mechanism of solder bubbles in PCB vias during high-temperature assembly”,
Circuit World
, Vol. 39 No. 3, pp. 133-138.
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