Thermal warpage analysis of PBGA mounted on PCB during reflow process by FEM and experimental measurement

Author:

Xia Weisheng,Xiao Ming,Chen Yihao,Wu Fengshun,Liu Zhe,Fu Hongzhi

Abstract

Purpose – The purpose of this paper is to study the thermal warpage of a plastic ball grid array (PBGA) mounted on a printed circuit board (PCB) during the reflow process. Design/methodology/approach – A thermal-mechanical coupling method that used finite-element method software (ANSYS 13.1) was performed. Meanwhile, a shadow moiré apparatus (TherMoiré PS200) combined with a heating platform was used for the experimental measurement of the warpage of PBGA according to the JEDEC Standard. Findings – The authors found that the temperature profiles taken from the simulated results and experimental measurement are consistent with each other, only with a little and acceptable difference in the maximum temperatures. Furthermore, the maximum warpage measurements during the reflow process are 0.157 mm and 0.149 mm for simulation and experimental measurements, respectively, with a small 5.37 per cent difference. The experimental measurement and simulated results are well correlated. Based on the validated finite element model, two factors, namely, the thickness and dimension of PCB, are explored about their effect on the thermal warpage of PBGA mounted on PCB during the reflow process. Practical implications – The paper provides a thorough parametrical study of the thermal warpage of PBGA mounted on PCB during the reflow process. Originality/value – The findings in this paper illustrate methods of warpage study by combination of thermal-mechanical finite element simulation and experimental measurement, which can provide good guidelines of the PCB design in the perspective of thermal warpage during the reflow process.

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science,Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

Reference35 articles.

1. Chena, H.-Y. , Hsu, K.-Y , Lin, T.-S. and Leu, J. (2008), “Thermal behavior analysis of lead-free flip-chip ball grid array packages with different underfill material properties”, 9th International Conference on Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 28-31 July, Shanghai, pp. 1-7.

2. Chong, D.Y.R. , Wang, C.K. , Fang, K.C. and Lall, P. (2003), “Finite element parametric analysis on fine-pitch BGA(FBGA) packages”, International Electronic Packaging Technical Conference and Exhibition, Proceedings of IPACK03, Maui, HI, pp. 1-7.

3. Guedon-Gracia, A. , Woirgard, E. and Zardini, C. (2008), “Reliability of lead-free BGA assembly: correlation between accelerated ageing tests and FE simulations”, IEEE Transactions on Device and Materials Reliability, Vol. 8 No. 3, pp. 449-454.

4. Hu, G. , Luan, J.-E. and Chew, S. (2009), “Characterization of chemical cure shrinkage of epoxy molding compound with application to warpage analysis”, ASME Journal of Electronic Packaging, Vol. 131 No. 1, pp. 0110101-0110106.

5. JEDEC Standard (2009), “Package Warpage measurement of surface-mount integrated circuits at elevated temperature”, in JEDEC, S. S. T. A. (Ed. JESD22-B112A).

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