Structural characterization of inkjet printed capacitor layers in various technological conditions

Abstract

Purpose The purpose of this paper is to analyze the individual steps during the printing of capacitor structures. The method of substrate preparation, the obtained roughness of conductive and dielectric layers are examined. Moreover, the capacitances of the obtained capacitors were examined. Design/methodology/approach Surface roughness and microscopic analysis were used to assess the quality of printed conductive structures. Two criteria were used to assess the quality of printed dielectric structures: the necessary lack of discontinuity of layers and minimal roughness. To determine the importance of printing parameters, a draft experimental method was proposed. Findings The optimal way to clean the substrate has been determined. The most important parameters for the dielectric layer (i.e. drop-space, table temperature, curing time and temperature) were found. Research limitations/implications If dielectric layers are printed correctly, most problems with printing complex electronic structures (transistors, capacitors) will be eliminated. Practical implications The tests performed identified the most important factors for dielectric layers. Using them, capacitors of repeatable capacity were printed. Originality/value In the literature on this subject, no factors were found which were responsible for obtaining homogeneous dielectric layers.