Lifetime estimation of tantalum capacitor for mobile applications using empirical and experimental techniques: a DOE approach

Abstract

PurposeCapacitors are one of the most common passive components on a circuit board. From a tiny toy to substantial satellite, a capacitor plays an important role. Untimely failure of a capacitor can destruct the entire system. This research paper targets the reliability assessment of tantalum capacitor, to reduce e-waste and enhance its reusable capability.Design/methodology/approachThe residual lifetime of a tantalum capacitor is estimated using the empirical method, i.e. military handbook MILHDBK2017F, and validated using an experimental approach, i.e. accelerated life testing (ALT). The various influencing acceleration factors are explored, and experiments are designed using Taguchi's approach. Empirical methods such as the military handbook is used for assessing the reliability of a tantalum capacitor, for ground and mobile applications.FindingsAfter exploring the lifetime of a tantalum capacitor using empirical and experimental techniques, an error analysis is conducted, which shows the validity of empirical technique, with an accuracy of 95.21%.Originality/valueThe condition monitoring and health prognostics of tantalum capacitors, for ground and mobile applications, are explored using empirical and experimental techniques, which warns the user about its residual lifetime so that the faulty component can be replaced in time.