Abstract
SiC/C based fibers (SCS) have exciting possibilities as reinforcements in advanced metal and ceramic matrix composite materials and there has been a growing interest in preparing specimens of these fibers for TEM studies. Unfortunately, the task of preparing very thin cross section of entire fibers is difficult because the constituent materials making up the fibers have widely different ion milling rates i.e. a carbon core surrounded by a SiC layer coated internally and externally with carbon. In this article, a rapid and reliable technique for preparing TEM specimen of the SCS-6 SiC fiber (manufactured by Textron) is described and together with the results of CTEM, HREM and PEELS studies. The technique is based on a general method of TEM specimen preparation of small objects, e.g. fibers and powder, reported elsewhere.
Publisher
Cambridge University Press (CUP)
Reference4 articles.
1. Alani, R. to be published in the Proc. of 10th Anniv. of Chinese Electron Microscopy Society, (1991)
2. Chemically Assisted Ion Beam Etching (CAIBE)- a New Technique for TEM Specimen Preparation of Materials
3. An application of EELS in the examination of inclusions and grain boundaries of a SiC ceramic
4. Ning, X. J. and Pirouz, P. submitted for publication in Journal of Materials Research, (1991)
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献