Ultra-Low kV EDS – A New Approach to Improved Spatial Resolution, Surface Sensitivity, and Light Element Compositional Imaging and Analysis in the SEM-Reference-Cited by-同舟云学术

Ultra-Low kV EDS – A New Approach to Improved Spatial Resolution, Surface Sensitivity, and Light Element Compositional Imaging and Analysis in the SEM

Published:2017-03 Issue:2 Volume:25 Page:20-29
ISSN:1551-9295
Container-title:Microscopy Today
language:en
Short-container-title:Micros. Today

Author:

Burgess Simon,Sagar James,Holland James,Li Xiaobing,Bauer Frank

Publisher

Cambridge University Press (CUP)

Subject

General Medicine

Reference15 articles.

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2. Li X et al., Microsc Microanal, late breaking poster, 2012.

3. Using Windowless EDS Analysis of 45-1000eV X-ray Lines to Extend the Boundaries of EDS Nanoanalysis in the SEM

4. Microstructural Analysis of 3D-Printed Alloy 718

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