Collection Efficiency of the Twin EDS Detectors for Quantitative X-ray Analysis on A New Probe-Corrected TEM/STEM
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference4 articles.
1. A Ge/SiNx Standard for Evaluating the Performance of X-ray Detectors in the SEM, S/TEM and AEM
2. Direct Comparison of X-ray Detector Solid Angles in Analytical Electron Microscopes
3. Research supported by NSF grant number 1531243 and NASA grant numbers NNX15AJ22G and NNX12AL47G. The work was carried out at the Kuiper Core Imaging and Microscopy Facility, University of Arizona. We thank Dr. Nestor Zaluzec for the insightful discussions..
4. Analytical Formulae for Calculation of X-Ray Detector Solid Angles in the Scanning and Scanning/Transmission Analytical Electron Microscope
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. X-ray Spectrometry in the Era of Aberration-Corrected Electron Optical Beam Lines;Microscopy and Microanalysis;2023-01-14
2. Quantitative Assessment and Measurement of X-ray Detector Performance and Solid Angle in the Analytical Electron Microscope;Microscopy and Microanalysis;2021-12-09
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