100,000 Diffraction Patterns per Second with Live Processing for 4D-STEM
Author:
Affiliation:
1. Nion Co. R&D , Kirkland, WA, USA
2. Humboldt-Universität zu Berlin Department of Physics & IRIS Adlershof, , Berlin, Germany
3. DECTRIS Ltd. , Baden-Daettwil, Switzerland
4. Arizona State University Department of Physics, , Tempe AZ, USA
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
https://academic.oup.com/mam/article-pdf/28/S1/422/48823445/mam0422.pdf
Reference7 articles.
1. Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
2. Hybrid pixel direct detector for electron energy loss spectroscopy
3. Using Nion Swift for Data Collection, Analysis and Display
4. High-Fidelity 4D-STEM Enabled by Live Processing at 15’000 Detector Frames Per Second
5. 5D-STEM: Live processing and display at 15,000 diffraction patterns per second
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