Results from a New Fast, High Sensitivity, Eels Spectrometer

Author:

Trevor C.,Harmon R.,Brink H.,Hunt J.

Abstract

Last year we discussed the performance of a new parallel EELS spectrometer, the ENFINA. The spectrometer optics have been considerably improved over past designs and the detector changed from a photodiode to a charge coupled device that was designed specifically for spectroscopy. in this work we present application examples that demonstrate some of the capabilities of the ENFINA.STEM spectrum imaging requires a spectrometer of high speed and sensitivity if useful data is to be collected in a short period of time. The ENFINAspectrometer achieves both of these through a radically improved point spread function, increased sensitivity, and fast detector readout. Useful spectrum images can be acquired in a few minutes. Figure 1 shows a dark-field STEM image of a typical semiconductor. A spectrum image containing 190 x 150 spectra was acquired from within the marked area.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

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