Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions-Reference-Cited by-同舟云学术

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Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions

Published:2022-08-01 Issue:S1 Volume:28 Page:34-35
ISSN:1435-8115
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Eswara Santhana¹,Tabean Saba¹,Mousley Michael¹,Hoang Quang Hung¹,Bouton Olivier¹,De Castro Olivier¹,Serralta Eduardo²,Klingner Nico²,Hlawacek Gregor²,Wirtz Tom¹

Affiliation:

1. Luxembourg Institute of Science and Technology (LIST) Advanced Instrumentation for Nano-Analytics (AINA), , Materials Research and Technology Department, Belvaux, Luxembourg

2. Institute of Ion Beam Physics and Materials Research , Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/28/S1/34/48822518/mam0034.pdf

Reference5 articles.

1. Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns

2. Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector

3. npSCOPE: A New Multimodal Instrument for In Situ Correlative Analysis of Nanoparticles

4. Quantitative nanoscale imaging using transmission He ion channelling contrast: Proof-of-concept and application to study isolated crystalline defects

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