Incorporation of an Amptek Silicon Drift Detector into a Wavelength Dispersive Spectrometer (WDS) Replacing the Gas Flow Proportional Counter
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference5 articles.
1. The authors wish to thank Amptek for their help in supplying the detectors, in particular John Pantazis.
2. Quantitative Bulk and Trace Element X-Ray Mapping Using Multiple Detectors
3. Moran K. & Wuhrer R. 14th Biennial Australian Microbeam Analysis Symposium AMAS 2017). p. 84.
4. Dedicated X-Ray mapping system with single and multiple SDD detectors for quantitative X-Ray mapping and data processing
5. Current State of Combined EDS-WDS Quantitative X-Ray Mapping
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1. Utilising the WDS-SD for Obtaining Better Estimations of Backgrounds and Mass Attenuation Coefficients;Microscopy and Microanalysis;2024-07
2. WDS-SD: Next Generation of Wavelength Dispersive Spectrometers (WDS) with a Silicon Drift Detector (SDD) – What Can it Do, Where Are We Now and Where is It Going?;Microscopy and Microanalysis;2023-07-22
3. Reasons to Replace a Proportional Counter (PC) in the Wavelength Dispersive Spectrometer (WDS) with a Silicon Drift Detector (SDD);Microscopy and Microanalysis;2020-07-30
4. SD-WDS: Bremsstrahlung Determination by Theoretical Calculation and Subsequent Estimation of Mass Attenuation Coefficients;Microscopy and Microanalysis;2019-08
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