WDS-SD: Next Generation of Wavelength Dispersive Spectrometers (WDS) with a Silicon Drift Detector (SDD) – What Can it Do, Where Are We Now and Where is It Going?-Reference-Cited by-同舟云学术

WDS-SD: Next Generation of Wavelength Dispersive Spectrometers (WDS) with a Silicon Drift Detector (SDD) – What Can it Do, Where Are We Now and Where is It Going?

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:846-848
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Wuhrer Richard¹,Moran Ken²,Matthews Michael³

Affiliation:

1. Western Sydney University, Advanced Materials Characterisation Facility (AMCF) , Australia

2. Moran Scientific Pty Ltd , Bungonia, NSW , Australia

3. AWE , Aldermaston, Reading , UK

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/846/50933474/ozad067.420.pdf

Reference12 articles.

1. A new life for the wavelength-dispersive X-ray spectrometer (WDS): incorporation of a silicon drift detector into the WDS for improved quantification and X-ray mapping;Wuhrer,2017

2. Current State of Combined EDS-WDS Quantitative X-Ray Mapping

3. Incorporation of an Amptek Silicon Drift Detector into a Wavelength Dispersive Spectrometer (WDS) Replacing the Gas Flow Proportional Counter

4. SD-WDS Second Order Bremsstrahlung and Peak to Background Ratios

5. Silicon Drift Detector Incorporated into Wavelength Dispersive Spectrometer (SD-WDS) – Allowing Bremsstrahlung Determination by Theoretical Calculation;Moran;EMAS,2019

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1. What Does the Proportional Counter Really See: The WDS-SD Shows Us;Microscopy and Microanalysis;2024-07

2. Shortcomings in Low-Energy X-ray Quantification using Proportional Counters in WDS;Microscopy and Microanalysis;2024-07