Benchmarking the Performance of a New Photoelectron Source
Author:
Affiliation:
1. Trinity College Dublin School of Physics, , Dublin, Ireland
2. Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) Advanced Microscopy Laboratory, , Dublin, Ireland
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
https://academic.oup.com/mam/article-pdf/28/S1/2914/48824212/mam2914.pdf
Reference5 articles.
1. Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV;Linck;Phys. Rev. Lett,2016
2. Radiation damage to organic and inorganic specimens in the TEM;Egerton;Micron,2019
3. Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging;Quigley;Microsc. Microanal
4. Development of a UHV-compatible Low-energy Electron Gun using the Photoelectric Effect;Sawa;J. Vac. Soc. Japan,2017
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