Robotic Fabrication of High-quality Lamellae for Aberration-corrected Transmission Electron Microscopy-Reference-Cited by-同舟云学术

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Robotic Fabrication of High-quality Lamellae for Aberration-corrected Transmission Electron Microscopy

Published:2022-08-01 Issue:S1 Volume:28 Page:54-56
ISSN:1435-8115
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Dutka Mikhail¹,Van Leer Brandon²,Tsurusawa Hideyo³,Nakanishi Nobuto³,Kawano Kayoko³,Cheng Yiquiang¹,Mizoguchi Teruyasu⁴

Affiliation:

1. Thermo Fisher Scientific , Eindhoven, The Netherlands

2. Thermo Fisher Scientific , Hillsboro, OR, USA

3. FEI Japan Ltd. Thermo Fisher Scientific, , Shinagawa-ku, Tokyo, Japan

4. University of Tokyo Institute of Industrial Science, , Meguro-ku, Tokyo, Japan

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/28/S1/54/48822183/mam0054.pdf

Reference4 articles.

1. TEM Sample Preparation and FIB-Induced Damage

2. Sample preparation for atomic-resolution STEM at low voltages by FIB

3. New Workflows Broaden Access to S/TEM Analysis and Increase Productivity

4. Robotic fabrication of high-quality lamellae for aberration-corrected transmission electron microscopy

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Systematic study of FIB-induced damage for the high-quality TEM sample preparation;Ultramicroscopy;2024-08

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