Author:
Curtis Wyatt,Flannigan David
Publisher
Cambridge University Press (CUP)
Reference12 articles.
1. Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes
2. 8. De Loos, M. J. ; Van der Geer, S. B . General Particle Tracer: A New 3D Code for Accelerator and Beamline Design. Proceedings of the European Particle Accelerator Conference, Sitges (Barcelona), Spain, June 10-14, 1996, p. 1241.
3. Thermionic and threshold photoemission energy distributions from LaB6(110)