Nanowire Transistors

Author:

Colinge Jean-Pierre,Greer James C.

Publisher

Cambridge University Press

Cited by 43 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Simulation of different structured gate-all-around FETs for 2 nm node;Engineering Research Express;2024-08-07

2. Unraveling the Dynamics of HfO2-Based NW-CTT as an Artificial Synapse;IEEE Transactions on Electron Devices;2024-08

3. Physical Analysis of Lateral-BTBT Induced GIDL Current in GaN-Based FinFET Devices;2024 IEEE Open Conference of Electrical, Electronic and Information Sciences (eStream);2024-04-25

4. Comprehensive evaluation of gate-induced drain leakage in SOI stacked nanowire nMOSFETs operating in high-temperatures;Solid-State Electronics;2024-04

5. Three-dimensional quantum-corrected Monte Carlo device simulator of n-FinFETs;Journal of Computational Electronics;2024-03-11

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