Author:
Voncken J. H. L.,Verkroost Th. W.
Abstract
X-ray powder diffraction data are reported for α-brass with the composition Cu: 63.44±0.04 wt %, Zn: 36.45±0.06 wt %. No valid reference card for this material is present in the JCPDS-ICDD database. The investigated brass composition is cubic (Fm3m) with a0: 3.69612±0.00014 Å, unit cell volume: 50.4938±0.0058 Å3, density calculated: 8.44±0.05 g/cm3, density measured: 8.43±0.03 g/cm3. The X-ray diffraction pattern presented resembles that of deleted reference card 6-657 in great detail.
Publisher
Cambridge University Press (CUP)
Subject
Condensed Matter Physics,Instrumentation,General Materials Science,Radiation
Reference7 articles.
1. X‐Ray Measurements of Stacking Faults and Internal Strains in α‐Cu‐Zn and α‐Cu‐Sn
2. Mäder, K. (1973). “Rekristallisation von α+β Messing,” Ph.D. thesis, Bochum University.
3. Study of Order in Annealed and Irradiated Alpha Brass by Lattice Parameter Measurements
4. Burnham, C. W. (1991). “Least Squares Refinement of Crystallographic Lattice Parameters Version 8.4,” Department of Earth and Planetary Sciences, Harvard University.
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献