Advances in STEM and EELS: New Operation Modes, Detectors and Software-Reference-Cited by-同舟云学术

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Advances in STEM and EELS: New Operation Modes, Detectors and Software

Published:2019-08 Issue:S2 Volume:25 Page:512-513
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Bleloch A.L.,Bacon N.J.,Corbin G.J.,Dellby N.,Hoffman M.V.,Hotz M.T.,Hrncirik P.,Johnson N.,Lovejoy T.C.,Meyer C.E.,Mittelberger A.,Plotkin-Swing B.,Skone G.S.,Szilagyi Z.S.,Krivanek O.L.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference6 articles.

1. Electron ptychography of 2D materials to deep sub-ångström resolution

2. Improving the STEM Spatial Resolution Limit

3. Nanoscale momentum-resolved vibrational spectroscopy

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Systematic Absences of Optical Phonon Modes in Phonon Dispersion Measured by Electron Microscopy;Physical Review Letters;2024-07-22

2. Beyond Vibrational Spectroscopy: Hunting the Signature of Elusive Quasiparticles with Monochromated STEM-EELS;Microscopy and Microanalysis;2024-07

3. Atomic-Scale Vibrational and Electronic Response of Interfaces in Heterostructures for Spintronics Applications;Microscopy and Microanalysis;2021-07-30

4. Four-dimensional vibrational spectroscopy for nanoscale mapping of phonon dispersion in BN nanotubes;Nature Communications;2021-02-19

5. Angle-Resolved Electron Energy Loss Spectroscopy;Microscopy and Microanalysis;2020-07-30

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