Angle-Resolved Electron Energy Loss Spectroscopy-Reference-Cited by-同舟云学术

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Angle-Resolved Electron Energy Loss Spectroscopy

Published:2020-07-30 Issue:S2 Volume:26 Page:964-965
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Lovejoy Tracy,Plotkin-Swing Benjamin,Dellby Niklas,Meyer Chris,Mittelberger Andreas,Eljarrat Alberto,Haas Benedikt,Koch Christoph,Krivanek Ondrej

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference8 articles.

1. Electron-energy losses in silicon: Bulk and surface plasmons and Čerenkov radiation

2. Advances in Ultra-High Energy Resolution STEM-EELS

3. Vibrational spectroscopy in the electron microscope

4. [5] Yan, X. , submitted (2020)

5. Advances in STEM and EELS: New Operation Modes, Detectors and Software

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1. Observation of the nonanalytic behavior of optical phonons in monolayer hexagonal boron nitride;Nature Communications;2024-03-02

2. Four-dimensional electron energy-loss spectroscopy;Ultramicroscopy;2023-11

3. Mapping Phonon Dispersion Surfaces at Nanometer Scale;Microscopy and Microanalysis;2023-07-22

4. Understanding Heterogeneities in Quantum Materials;Advanced Materials;2022-03-31

5. Unraveling electronic band structure of narrow-bandgap p–n nanojunctions in heterostructured nanowires;Physical Chemistry Chemical Physics;2021

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