Site-Specific FIB Preparation of Atom Probe Samples-Reference-Cited by-同舟云学术

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Site-Specific FIB Preparation of Atom Probe Samples

Published:2004-08 Issue:S02 Volume:10 Page:1150-1151
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Colijn Hendrik O.,Kelly Thomas F.,Ulfig R. M.,Buchheit Rudolf G.

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Anisotropic wet-chemical etching for preparation of freestanding films on Si substrates for atom probe tomography: A simple yet effective approach;Ultramicroscopy;2021-11

2. Nanoscale Analysis of Corrosion Products: A Review of the Application of Atom Probe and Complementary Microscopy Techniques;JOM;2018-06-11

3. Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses;Ultramicroscopy;2018-01

4. A simple approach to atom probe sample preparation by using shadow masks;Ultramicroscopy;2016-01

5. Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features;Ultramicroscopy;2014-12

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