Accurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Ion Beam (FIB) Preparation
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference4 articles.
1. TEM Sample Preparation and FIB-Induced Damage
2. Statistical control and optimization of X-ray intensity measurements
3. Measuring grain boundary segregation using Wavelength Dispersive X-ray Spectroscopy: Further developments
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