Information-tagged Data-acquisition System for On-the-fly Scanning
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference3 articles.
1. Probing the exciton-phonon coupling strengths of O-polar and Zn-polar ZnO wafer using hard X-ray excited optical luminescence
2. Peculiar near-band-edge emission of polarization-dependent XEOL from a non-polar a-plane ZnO wafer
3. Multimodal hard x-ray nanoprobe facility by nested Montel mirrors aimed for 40nm resolution at Taiwan Photon Source
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1. Physiology and molecular basis of thallium toxicity and accumulation in Arabidopsis thaliana;Ecotoxicology and Environmental Safety;2024-05
2. Probing the emission properties of color centers in MgAl2O4 wafers using hard X-ray nanoprobes;Optical Materials;2023-08
3. Observation of anomalous emissions of nonpolar a-plane MgZnO and ZnO epi-films based on XEOL and time-resolved XEOL in hybrid bunch mode;AIP Advances;2020-08-01
4. Capabilities of time-resolved X-ray excited optical luminescence of the Taiwan Photon Source 23A X-ray nanoprobe beamline;Journal of Synchrotron Radiation;2020-01-01
5. Hard X-ray nanoprobe and time-resolved XEOL to observe increasing luminescence of ZnO and GaN epitaxial structures;Applied Physics Letters;2019-10-21
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