The New X-ray Mapping: X-ray Spectrum Imaging above 100 kHz Output Count Rate with the Silicon Drift Detector
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference8 articles.
1. “Derived spectra” software tools for detecting spatial and spectral features in spectrum images
2. X-ray spectrometry and spectrum image mapping at output count rates above 100 kHz with a silicon drift detector on a scanning electron microscope
3. A New Improved Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications
4. Solid-State Energy-Dispersion Spectrometer for Electron-Microprobe X-ray Analysis
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