A low-cost concurrent TSV test architecture with lossless test output compression scheme-Reference-Cited by-同舟云学术

A low-cost concurrent TSV test architecture with lossless test output compression scheme

Published:2019-08-23 Issue:8 Volume:14 Page:e0221043
ISSN:1932-6203
Container-title:PLOS ONE
language:en
Short-container-title:PLoS ONE

Author:

Lee Young-woo,Lim Hyunchan,Seo Sungyoul,Cho Keewon,Kang Sungho^ORCID

Funder

National Research Foundation of Korea

Publisher

Public Library of Science (PLoS)

Subject

Multidisciplinary

Reference37 articles.

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