Analytical Review of Two-Signal Methods for Measuring the S-Parameters of Two-Port Networks

Author:

Savel’kaev S. V.,Litovchenko V. A.,Zarzhetskaya N. V.

Publisher

Allerton Press

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference10 articles.

1. S. R. Mazumder and P. D. Van der Puije, “Two-Signal Method of Measuring the Large-Signal S-Parameters of Transistors,” IEEE Trans. Microwave Theory and Techn. MTT-26(6), 417–420 (1978).

2. S. H. Li and R. G. Bosisio, “Automatic Analysis of Two-Port Active Microwave Network,” Electron. Lett. 18(24), 1033–1034 (1982).

3. S. V. Savel’kaev and S. V. Romas’ko, “Method of Measuring the S-Parameters of Two-Port Networks in Microstrip Lines,” Vestn. SGUGiT 22(2), 260–270 (2017).

4. S. V. Savel’kaev and S. V. Romas’ko, “A Method of Measuring the S-Parameters of Transistors on a Simulator-Analyzer of Amplifiers and UNF Self-Excited Oscillators Metrologiya,” No. 2, 31–44 (2017) [Meas. Tech., No. 2, 612–619 (2017)].

5. S. V. Savel’kaev and V. A. Litovchenko, “Analysis and Synthesis of Methods for Measuring the S-Parameters of Microwave Transistors,” Metrologiya, No. 4, 51–63 (2018) [Meas. Tech. 61 (12), 1223–1227 (2019).

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