Adatom concentration distribution on an extrawide Si(111) terrace during sublimation

Author:

Rogilo D. I.,Rybin N. E.,Fedina L. I.,Latyshev A. V.

Publisher

Allerton Press

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference25 articles.

1. C. Misbah, O. Pierre-Louis, Y. Saito, “Crystal Surfaces in and out of Equilibrium: A Modern View,” Rev. Mod. Phys. 82 (1), 981–1040 (2010).

2. J. W. Evans, P. A. Thiel, M. C. Bartelt, “Morphological Evolution during Epitaxial thin Film Growth: Formation of 2D Islands and 3D Mounds,” Surf. Sci. Rep. 61 (1–2), 1–128 (2006).

3. D. I. Rogilo, L. I. Fedina, S. S. Kosolobov, et al., “Critical Terrace width for Two-Dimensional Nucleation during Si Growth on Si(111)-(7 × 7) Surface,” Phys. Rev. Lett. 111 (3), 036105 (2013).

4. D. I. Rogilo, N. E. Rybin, S. S. Kosolobov, et al., “Nucleation of Two-Dimensional Si Islands near a Monatomic Step on an Atomically Clean Si(111)-(7×7) Surface,” Avtometriya 52 (3), 86–92 (2016) [Optoelectron., Instrum. Data Process. 52 (3), 286–291 (2016)].

5. A. I. Nikiforov, V. A. Timofeev, S. A. Teys, and O. P. Pchelyakov, “Formation of Ge/Si and Ge/GexSi1−x /Si Nanoheterostructures by Molecular Beam Epitaxy,” Avtometriya 50 (3), 5–12 (2014) [Optoelectron., Instrum. Data Process. 50 (3), 217–223 (2014)].

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