Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference10 articles.
1. P. De Groot, J. Biegen, J. Clark, et al., “Optical Interferometry for Measurement of the Geometric Dimensions of Industrial Parts,” Appl. Opt. 41(19), 3853 (2002).
2. M. Davidson, K. Kaufman, and I. Mazor, “The Coherence Probe Microscope,” Solid State Technol. 30, 57 (1987).
3. P. J. Caber, S. J. Martinek, and R. J. Niemann, “A New Interferometric Profiler for Smooth and Rough Surface,” Proc. SPIE 2088, 195 (1993).
4. D. J. Aziz, “Interferometric Measurement of Surface Roughness in Engine Cylinder Walls,” Opt. Eng. 37(5), 1429 (1998).
5. P. De Groot, X. C. De Lega, J. Kramer, and M. Turzhitsky, “Determination of Fringe Order in White-Light Interference Microscopy,” Appl. Opt. 41(22), 4571 (2002).
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献